Material science and metrology X-ray systems offer measuring solutions used to make various components – from micro and macro parts, up to large engines and wind turbines more robust, safer and energy efficient.
What is material science? Looking at the structure of materials at an atomic scale and taking direct structural measurements. There are different X-ray methods of measuring materials -including metrology, fluorescence, diffraction and crystallography. Metrology is the process of taking a set of CT images of a component to measure it, applying a number of tests to the component (for example stress, thermal cycling and humidity) then taking another set of CT images and analyzing the changes. X-ray diffraction and crystallography are used to identify the atomic properties of materials. X-rays are diffracted by the regular three-dimensional arrangements of atoms in crystals, and the resulting diffraction patterns are recorded by an imaging plate or detector. From the diffraction pattern it is possible to diagnose that it is a particular material. The diffraction patterns are compared against those in a computerized database to find a match. XRF (X-ray fluorescence) is a non-destructive analytical technique used to determine the elemental composition of materials. XRF analyzers determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source. It is used for testing gauge thickness of metals and coatings.
From Scientific research to Industrial quality control (for example: Turbine casting quality checks in the aerospace industry) – our X-ray components enhance measuring technology ensuring maximum standards of quality wherever high precision is essential. With their:
- High dynamic range and contrast
- High saturation dose
- High sensitivity and contrast at low doses
- High speed and low lag of our CMOS detectors
- Low noise
- Wide energy range and different target materials
- Varex Imaging X-ray flat panel detectors and tubes provide significant advantages for many scientific X-ray applications.
